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Electron Probe


A JEOL JXA8600 Scanning Electron Microscope is housed within the Department of Earth Sciences and is used for secondary electron, backscattered electron and cathode luminescence imaging of minerals and rocks. Image modes include secondary electron and backscattered electron modes. Upgrade of this instrument to include full electron probe X-ray microanalysis and cathode luminescence imaging capabilities was made possible with funding from NSF's Instrumentation & Facilities Program, and cost-shared by Syracuse University. This instrument is used regularly by undergraduate and graduate researchers as well as in various graduate and undergraduate courses.